Combining electron microscopy and X-ray techniques
نویسندگان
چکیده
منابع مشابه
Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملCombining X-ray and electron-microscopy data to solve crystal structures
Low-resolution electron-microscopy reconstructions can be used as search models in molecular replacement or may be combined with existing monomeric structures in order to produce multimeric models suitable for molecular replacement. The technique is described in the case of viral and subviral particles as well as in the case of oligomeric proteins.
متن کاملCombining scanning probe microscopy and x-ray spectroscopy
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with oth...
متن کاملAlgebraic reconstruction techniques (ART) for three-dimensional electron microscopy and x-ray photography.
We give a ncw method for direct reconstruction of threc-dimcnsional objects from a fcw electron micrographs taken at angles which nced not exceed a range of 60 degrees. Thc method works for totally asymmctric objects, and rcquircs littlc computer timc or storage. It is also applicable to X-ray photography. and may greatly reduce the exposurc compared to current methods of body-scction radiography.
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2007
ISSN: 0108-7673
DOI: 10.1107/s0108767307099898